MProbe® Thin Film Measurement Systems
Majority of translucent or lightly absorbing films can be measured quickly and reliably:Oxides,Nitrides, Photoresists, Polymers, Semiconductors (Si, aSi, polySi), Compound Semiconductors (AlGaAs, InGaAs, CdTe,CIGS),Hard coatings (SiC, DLC), Polymer coat-
ings (Paralene, PMMA, Polyamides), thin metal films and many more.
Thickness Range: 1 nm - 1.8 mm
Wavelength Range: 200nm -1700nm
Spot size: 0.5 mm
Thin Solar Cells applications: aSi, TCO, CIGS, CdS, CdTe
- full solar stack measurement. LCD, FPD application: ITO, Cell Gaps, Polyamides. Optical Coatings: dielectric filters, hardness coating, anti-reflection coating Semiconductor and dielectics: Oxides, Nitrides, OLED stack
Real time measurement and analysis. Multi-layer, thin,thick, freestanding and nonuniform layers.
Extensive materials library (500+ materials) - new mate- rials easily added. Support of parameterized materials:
Cauchy, Tauc-Lorentz, Cody-Lorentz, EMA and many more....
Flexible: Desktop or in-situ, R&D on inline. Easy integra- tion with external system using TCP or Modbus interface
Measurement: thickness, optical constants, surface rough- ness
User friedly and powerful: One-click measurement and analysis. Powerful tools: simulation & sensitivity, back- ground and scaling correction,linked layers and materials, multisample measurements, dynamic measurement and production batch processing.
Tags: thin film coating spin coater, thin film coating spin coater manufacturers, thin film coating spin coater suppliers, thin film coating spin coater quotation
If you want to know more products, we have: spin coater, spin coater spin master, spin coater spin master manufacturers